Chao-Wen Tseng

2004
10	EE	Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra: ELF-Murphy Data on Defects and Test Sets. VTS 2004: 16-22
2002
9	EE	Chao-Wen Tseng, James Li, Edward J. McCluskey: Experimental Results for Slow-Speed Testing. VTS 2002: 37-42
2001
8		Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey: Testing for resistive opens and stuck opens. ITC 2001: 1049-1058
7		Chao-Wen Tseng, Edward J. McCluskey: Multiple-output propagation transition fault test. ITC 2001: 358-366
6	EE	Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh: MINVDD Testing for Weak CMOS ICs. VTS 2001: 339-345
5	EE	Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson: An Evaluation of Pseudo Random Testing for Detecting Real Defects. VTS 2001: 404-410
2000
4		Edward J. McCluskey, Chao-Wen Tseng: Stuck-fault tests vs. actual defects. ITC 2000: 336-343
3	EE	Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao, David M. Wu: Cold Delay Defect Screening. VTS 2000: 183-188
1998
2	EE	Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey: Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. ITC 1998: 184-193
1	EE	Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey: Experimental Results for IDDQ and VLV Testing. VTS 1998: 118-125

Coauthor Index

1	Ahmad A. Al-Yamani	[10]
2	Jonathan T.-Y. Chang	[1] [2]
3	Ray Chen	[6]
4	Yi-Chin Chu	[1]
5	Scott Davidson	[5]
6	François-Fabien Ferhani	[10]
7	Chien-Mo James Li (James Chien-Mo Li)	[2] [8] [10]
8	Edward Li	[10]
9	James Li	[9]
10	Edward J. McCluskey	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10]
11	Subhasish Mitra	[5] [10]
12	Phil Nigh	[6]
13	Mike Purtell	[1] [2] [8]
14	Xiaoping Shao	[3]
15	Erik H. Volkerink	[10]
16	Sanjay Wattal	[1]
17	David M. Wu	[3]