2002 |
3 | EE | Franco Stellari,
Peilin Song,
James C. Tsang,
Moyra K. McManus,
Mark B. Ketchen:
Optical diagnosis of excess IDDQ in low power CMOS circuits.
Microelectronics Reliability 42(9-11): 1689-1694 (2002) |
2000 |
2 | EE | James C. Tsang,
Jeffrey A. Kash,
David P. Vallett:
Picosecond imaging circuit analysis.
IBM Journal of Research and Development 44(4): 583-604 (2000) |
1998 |
1 | EE | Daniel R. Knebel,
Pia Sanda,
Moyra K. McManus,
Jeffrey A. Kash,
James C. Tsang,
David P. Vallett,
Leendert M. Huisman,
Phil Nigh,
Rick Rizzolo,
Peilin Song,
Franco Motika:
Diagnosis and characterization of timing-related defects by time-dependent light emission.
ITC 1998: 733-739 |