Ray Chen

2001
1	EE	Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh: MINVDD Testing for Weak CMOS ICs. VTS 2001: 339-345

Coauthor Index

1	Edward J. McCluskey	[1]
2	Phil Nigh	[1]
3	Chao-Wen Tseng	[1]