Teppei Takeda

2003
2	EE	Masaki Hashizume, Teppei Takeda, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura, Kozo Kinoshita: A BIST Circuit for IDDQ Tests. Asian Test Symposium 2003: 390-395
2001
1	EE	Teppei Takeda, Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Yukiya Miura, Kozo Kinoshita: IDDQ Sensing Technique for High Speed IDDQ Testing. Asian Test Symposium 2001: 111-116

Coauthor Index

1	Masaki Hashizume	[1] [2]
2	Masahiro Ichimiya	[1]
3	Kozo Kinoshita	[1] [2]
4	Yukiya Miura	[1] [2]
5	Takeomi Tamesada	[2]
6	Hiroyuki Yotsuyanagi	[1] [2]