Shinsuke Hata

2001
1	EE	Hiroyuki Yotsuyanagi, Shinsuke Hata, Masaki Hashizume, Takeomi Tamesada: Sequential Redundancy Removal Using Test Generation and Multiple Unreachable States. Asian Test Symposium 2001: 23-

Coauthor Index

1	Masaki Hashizume	[1]
2	Takeomi Tamesada	[1]
3	Hiroyuki Yotsuyanagi	[1]