2002 | ||
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2 | EE | Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada: Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field. DELTA 2002: 387-391 |
2001 | ||
1 | EE | Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada: Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field. DFT 2001: 287- |
1 | Masaki Hashizume | [1] [2] |
2 | Masahiro Ichimiya | [1] [2] |
3 | Takeomi Tamesada | [1] [2] |
4 | Hiroyuki Yotsuyanagi | [1] [2] |