Taisuke Iwakiri

2002
2	EE	Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada: Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field. DELTA 2002: 387-391
2001
1	EE	Hiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada: Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field. DFT 2001: 287-

Coauthor Index

1	Masaki Hashizume	[1] [2]
2	Masahiro Ichimiya	[1] [2]
3	Takeomi Tamesada	[1] [2]
4	Hiroyuki Yotsuyanagi	[1] [2]