| 2007 |
|---|
| 6 | EE | Hideyuki Ichihara,
Toshimasa Kuchii,
Masaaki Yamadate,
Hideaki Sakaguchi,
Hiroshi Uemura,
Kozo Kinoshita:
A statistical error model for image sensors and its testing.
Systems and Computers in Japan 38(11): 1-11 (2007) |
| 2005 |
|---|
| 5 | EE | Hiroyuki Yotsuyanagi,
Toshimasa Kuchii,
Shigeki Nishikawa,
Masaki Hashizume,
Kozo Kinoshita:
Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees.
J. Electronic Testing 21(6): 613-620 (2005) |
| 2004 |
|---|
| 4 | EE | Hiroyuki Yotsuyanagi,
Toshimasa Kuchii,
Shigeki Nishikawa,
Masaki Hashizume,
Kozo Kinoshita:
On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure.
DELTA 2004: 269-274 |
| 2003 |
|---|
| 3 | EE | Hiroyuki Yotsuyanagi,
Toshimasa Kuchii,
Shigeki Nishikawa,
Masaki Hashizume,
Kozo Kinoshita:
Reducing Scan Shifts Using Folding Scan Trees.
Asian Test Symposium 2003: 6-11 |
| 1997 |
|---|
| 2 | EE | Masaki Hashizume,
Toshimasa Kuchii,
Takeomi Tamesada:
Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates.
Asian Test Symposium 1997: 372-377 |
| 1996 |
|---|
| 1 | EE | Toshimasa Kuchii,
Masaki Hashizume,
Takeomi Tamesada:
Algorithmic Test Generation for Supply Current Testing of TTL Combinational Circuits.
Asian Test Symposium 1996: 171-176 |
