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Toshimasa Kuchii

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2007
6EEHideyuki Ichihara, Toshimasa Kuchii, Masaaki Yamadate, Hideaki Sakaguchi, Hiroshi Uemura, Kozo Kinoshita: A statistical error model for image sensors and its testing. Systems and Computers in Japan 38(11): 1-11 (2007)
2005
5EEHiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita: Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees. J. Electronic Testing 21(6): 613-620 (2005)
2004
4EEHiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita: On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure. DELTA 2004: 269-274
2003
3EEHiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita: Reducing Scan Shifts Using Folding Scan Trees. Asian Test Symposium 2003: 6-11
1997
2EEMasaki Hashizume, Toshimasa Kuchii, Takeomi Tamesada: Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates. Asian Test Symposium 1997: 372-377
1996
1EEToshimasa Kuchii, Masaki Hashizume, Takeomi Tamesada: Algorithmic Test Generation for Supply Current Testing of TTL Combinational Circuits. Asian Test Symposium 1996: 171-176

Coauthor Index

1Masaki Hashizume [1] [2] [3] [4] [5]
2Hideyuki Ichihara [6]
3Kozo Kinoshita [3] [4] [5] [6]
4Shigeki Nishikawa [3] [4] [5]
5Hideaki Sakaguchi [6]
6Takeomi Tamesada [1] [2]
7Hiroshi Uemura [6]
8Masaaki Yamadate [6]
9Hiroyuki Yotsuyanagi [3] [4] [5]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)