2008 |
3 | EE | Yasuhiro Ogasahara,
Masanori Hashimoto,
Takao Onoye:
Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification.
ASP-DAC 2008: 107-108 |
2007 |
2 | EE | Yasuhiro Ogasahara,
Masanori Hashimoto,
Takao Onoye:
Quantitative Prediction of On-Chip Capacitive and Inductive Crosstalk Noise and Tradeoff between Wire Cross-Sectional Area and Inductive Crosstalk Effect.
IEICE Transactions 90-A(4): 724-731 (2007) |
2006 |
1 | EE | Yasuhiro Ogasahara,
Masanori Hashimoto,
Takao Onoye:
Quantitative Prediction of On-chip Capacitive and Inductive Crosstalk Noise and Discussion on Wire Cross-Sectional Area Toward Inductive Crosstalk Free Interconnects.
ICCD 2006 |