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Yasuhiro Ogasahara

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2008
3EEYasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye: Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification. ASP-DAC 2008: 107-108
2007
2EEYasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye: Quantitative Prediction of On-Chip Capacitive and Inductive Crosstalk Noise and Tradeoff between Wire Cross-Sectional Area and Inductive Crosstalk Effect. IEICE Transactions 90-A(4): 724-731 (2007)
2006
1EEYasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye: Quantitative Prediction of On-chip Capacitive and Inductive Crosstalk Noise and Discussion on Wire Cross-Sectional Area Toward Inductive Crosstalk Free Interconnects. ICCD 2006

Coauthor Index

1Masanori Hashimoto [1] [2] [3]
2Takao Onoye [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)