Yiwen Shi
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2008
1
EE
Yiwen Shi,
Kellie DiPalma
,
Jennifer Dworak
: Efficient Determination of Fault Criticality for Manufacturing Test Set Optimization.
DFT 2008
: 403-411
Coauthor
Index
1
Kellie DiPalma
[
1
]
2
Jennifer Dworak
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
