| |
| 1994 | ||
|---|---|---|
| 1 | EE | Uwe Gläser, Heinrich Theodor Vierhaus, M. Kley, A. Wiederhold: Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation. ICCAD 1994: 36-39 |
| 1 | Uwe Gläser | [1] |
| 2 | Heinrich Theodor Vierhaus | [1] |
| 3 | A. Wiederhold | [1] |