U. Gätzschmann
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2006
1
EE
Christian Galke
, U. Gätzschmann,
Heinrich Theodor Vierhaus
: Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes.
DSD 2006
: 433-438
Coauthor
Index
1
Christian Galke
[
1
]
2
Heinrich Theodor Vierhaus
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
