| |
| 2006 | ||
|---|---|---|
| 1 | EE | Christian Galke, René Kothe, S. Schultke, K. Winkler, J. Honko, Heinrich Theodor Vierhaus: Embedded Scan Test with Diagnostic Features for Self-Testing SoCs. IOLTS 2006: 181-182 |
| 1 | Christian Galke | [1] |
| 2 | René Kothe | [1] |
| 3 | S. Schultke | [1] |
| 4 | Heinrich Theodor Vierhaus | [1] |
| 5 | K. Winkler | [1] |