R. Wolber
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1994
1
R. Wolber,
Uwe Gläser
,
Heinrich Theodor Vierhaus
: Testability Analysis for Test Generation in Synchronous Sequential Circuits.
ICCD 1994
: 350-353
Coauthor
Index
1
Uwe Gläser
[
1
]
2
Heinrich Theodor Vierhaus
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
