| 2006 |
|---|
| 3 | EE | Ritesh P. Turakhia,
W. Robert Daasch,
Joel Lurkins,
Brady Benware:
Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers.
IEEE Design & Test of Computers 23(2): 100-109 (2006) |
| 2005 |
|---|
| 2 | EE | Ritesh P. Turakhia,
Brady Benware,
Robert Madge,
Thaddeus T. Shannon,
W. Robert Daasch:
Defect Screening Using Independent Component Analysis on I_DDQ.
VTS 2005: 427-432 |
| 2004 |
|---|
| 1 | EE | Robert Madge,
Brady Benware,
Ritesh P. Turakhia,
W. Robert Daasch,
Chris Schuermyer,
Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost.
ITC 2004: 203-212 |
