| |
| 2004 | ||
|---|---|---|
| 1 | EE | Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski: Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC 2004: 1285-1294 |
| 1 | Brady Benware | [1] |
| 2 | Mark Kassab | [1] |
| 3 | Martin Keim | [1] |
| 4 | Prabhu Krishnamurthy | [1] |
| 5 | Cam Lu | [1] |
| 6 | Robert Madge | [1] |
| 7 | Janusz Rajski | [1] |