| |
| 2002 | ||
|---|---|---|
| 1 | EE | Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner: Screening MinVDD Outliers Using Feed-Forward Voltage Testing. ITC 2002: 673-682 |
| 1 | W. Robert Daasch | [1] |
| 2 | B. H. Goh | [1] |
| 3 | Robert Madge | [1] |
| 4 | V. Rajagopalan | [1] |
| 5 | Chris Schuermyer | [1] |
| 6 | C. Taylor | [1] |
| 7 | David Turner | [1] |