| |
| 2004 | ||
|---|---|---|
| 2 | EE | Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler: In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212 |
| 1 | EE | Chris Schuermyer, Jens Ruffler, W. Robert Daasch: Minimum Testing Requirements to Screen Temperature Dependent Defects. ITC 2004: 300-308 |
| 1 | Brady Benware | [2] |
| 2 | W. Robert Daasch | [1] [2] |
| 3 | Robert Madge | [2] |
| 4 | Chris Schuermyer | [1] [2] |
| 5 | Ritesh P. Turakhia | [2] |