| |
| 2004 | ||
|---|---|---|
| 3 | EE | W. Robert Daasch, Manu Rehani: Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester. ITC 2004: 1428 |
| 2 | EE | Manu Rehani, David Abercrombie, Robert Madge, Jim Teisher, Jason Saw: ATE Data Collection - A comprehensive requirements proposal to maximize ROI of test. ITC 2004: 181-189 |
| 2002 | ||
| 1 | EE | Robert Madge, Manu Rehani, Kevin Cota, W. Robert Daasch: Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies. VTS 2002: 69-74 |
| 1 | David Abercrombie | [2] |
| 2 | Kevin Cota | [1] |
| 3 | W. Robert Daasch | [1] [3] |
| 4 | Robert Madge | [1] [2] |
| 5 | Jason Saw | [2] |
| 6 | Jim Teisher | [2] |