| |
| 2004 | ||
|---|---|---|
| 2 | EE | Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski: Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC 2004: 1285-1294 |
| 2003 | ||
| 1 | EE | Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch: Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS 2003: 39-46 |
| 1 | Brady Benware | [1] [2] |
| 2 | W. Robert Daasch | [1] |
| 3 | Mark Kassab | [2] |
| 4 | Martin Keim | [2] |
| 5 | Prabhu Krishnamurthy | [2] |
| 6 | Robert Madge | [1] [2] |
| 7 | Janusz Rajski | [2] |
| 8 | John Van Slyke | [2] |