| 2006 |
|---|
| 4 | EE | Xinyue Fan,
Will Moore,
Camelia Hora,
Mario H. Konijnenburg,
Guido Gronthoud:
A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis.
VTS 2006: 266-271 |
| 2000 |
|---|
| 3 | | Will Moore,
Guido Gronthoud,
Keith Baker,
Maurice Lousberg:
Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?
ITC 2000: 95-104 |
| 1995 |
|---|
| 2 | | Will Moore,
Wayne Luk:
Field-Programmable Logic and Applications, 5th International Workshop, FPL '95, Oxford, UK, August 29 - September 1, 1995, Proceedings
Springer 1995 |
| 1993 |
|---|
| 1 | EE | Will Moore,
Wayne Luk:
Introduction.
VLSI Signal Processing 6(2): 99-100 (1993) |
