2007 |
4 | EE | Rene Segers:
If It's All about Yield, Why Talk about Testing?
European Test Symposium 2007: 3 |
2003 |
3 | EE | Camelia Hora,
Rene Segers,
Stefan Eichenberger,
Maurice Lousberg:
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up.
J. Electronic Testing 19(4): 369-376 (2003) |
2002 |
2 | EE | Camelia Hora,
Rene Segers,
Stefan Eichenberger,
Maurice Lousberg:
An Effective Diagnosis Method to Support Yield Improvement.
ITC 2002: 260-269 |
1 | EE | Julie Segal,
Rene Segers,
Rob Aitken,
S. Eichenberge,
A. Gattike,
M. Millegen,
R. Seger,
S. Venkataraman:
Test as a Key Enabler for Faster Yield Ramp-Up.
VTS 2002: 177-180 |