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Rene Segers

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2007
4EERene Segers: If It's All about Yield, Why Talk about Testing? European Test Symposium 2007: 3
2003
3EECamelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg: On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up. J. Electronic Testing 19(4): 369-376 (2003)
2002
2EECamelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg: An Effective Diagnosis Method to Support Yield Improvement. ITC 2002: 260-269
1EEJulie Segal, Rene Segers, Rob Aitken, S. Eichenberge, A. Gattike, M. Millegen, R. Seger, S. Venkataraman: Test as a Key Enabler for Faster Yield Ramp-Up. VTS 2002: 177-180

Coauthor Index

1Rob Aitken [1]
2S. Eichenberge [1]
3Stefan Eichenberger [2] [3]
4A. Gattike [1]
5Camelia Hora [2] [3]
6Maurice Lousberg [2] [3]
7M. Millegen [1]
8Julie Segal [1]
9R. Seger [1]
10S. Venkataraman [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)