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Alex Biewenga

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1999
1 Alex Biewenga, Henk D. L. Hollmann, Frans de Jong, Maurice Lousberg: Static component interconnect test technology (SCITT) a new technology for assembly testing. ITC 1999: 439-448

Coauthor Index

1Henk D. L. Hollmann [1]
2Frans de Jong [1]
3Maurice Lousberg [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)