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2008 | ||
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1 | EE | Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang: A Prevenient Voltage Stress Test Method for High Density Memory. DELTA 2008: 516-520 |
1 | Sangseok Kang | [1] |
2 | Sungho Kang | [1] |
3 | Gunbae Kim | [1] |
4 | Byungheon Kwak | [1] |
5 | Hwacheol Lee | [1] |
6 | Jinseok Lee | [1] |
7 | Jonghyoung Lim | [1] |
8 | Incheol Nam | [1] |
9 | Jongsoo Yim | [1] |