| |
| 2008 | ||
|---|---|---|
| 1 | EE | Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang: A Prevenient Voltage Stress Test Method for High Density Memory. DELTA 2008: 516-520 |
| 1 | Sangseok Kang | [1] |
| 2 | Sungho Kang | [1] |
| 3 | Gunbae Kim | [1] |
| 4 | Byungheon Kwak | [1] |
| 5 | Hwacheol Lee | [1] |
| 6 | Jinseok Lee | [1] |
| 7 | Jonghyoung Lim | [1] |
| 8 | Incheol Nam | [1] |
| 9 | Jongsoo Yim | [1] |