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1999 | ||
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2 | EE | Jongchul Shin, Hyunjin Kim, Sungho Kang: At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks. DATE 1999: 473- |
1 | EE | Hyunjin Kim, Jongchul Shin, Sungho Kang: An Efficient Interconnect Test Using BIST Module in a Boundary-Scan Environment. ICCD 1999: 328-329 |
1 | Sungho Kang | [1] [2] |
2 | Hyunjin Kim | [1] [2] |