| |
| 2008 | ||
|---|---|---|
| 2 | EE | Kicheol Kim, Youbean Kim, Incheol Kim, HyeonUk Son, Sungho Kang: A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters. IEICE Transactions 91-C(4): 670-672 (2008) |
| 2007 | ||
| 1 | EE | Incheol Kim, Kicheol Kim, Youbean Kim, HyeonUk Son, Sungho Kang: A New Analog-to-Digital Converter BIST Considering a Transient Zone. IEICE Transactions 90-C(11): 2161-2163 (2007) |
| 1 | Sungho Kang | [1] [2] |
| 2 | Incheol Kim | [1] [2] |
| 3 | Kicheol Kim | [1] [2] |
| 4 | Youbean Kim | [1] [2] |