| |
| 2008 | ||
|---|---|---|
| 2 | EE | Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang: An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR. J. Electronic Testing 24(6): 591-595 (2008) |
| 2005 | ||
| 1 | EE | Youbean Kim, Myung-Hoon Yang, Yong Lee, Sungho Kang: A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture. Asian Test Symposium 2005: 230-235 |
| 1 | Sunghoon Chun | [2] |
| 2 | Sungho Kang | [1] [2] |
| 3 | YongJoon Kim | [2] |
| 4 | Youbean Kim | [1] |
| 5 | Yong Lee | [1] |