2008 |
4 | EE | Kicheol Kim,
Youbean Kim,
Incheol Kim,
HyeonUk Son,
Sungho Kang:
A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters.
IEICE Transactions 91-C(4): 670-672 (2008) |
3 | EE | Youbean Kim,
Kicheol Kim,
Incheol Kim,
Hyunwook Son,
Sungho Kang:
A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST.
IEICE Transactions 91-D(4): 1185-1188 (2008) |
2007 |
2 | EE | Incheol Kim,
Kicheol Kim,
Youbean Kim,
HyeonUk Son,
Sungho Kang:
A New Analog-to-Digital Converter BIST Considering a Transient Zone.
IEICE Transactions 90-C(11): 2161-2163 (2007) |
2005 |
1 | EE | Kicheol Kim,
DongSub Song,
Incheol Kim,
Sungho Kang:
A New Low Power Test Pattern Generator for BIST Architecture.
IEICE Transactions 88-C(10): 2037-2038 (2005) |