| |
| 1997 | ||
|---|---|---|
| 1 | EE | Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi: ATREX : Design for Testability System for Mega Gate LSIs. Asian Test Symposium 1997: 126- |
| 1 | Takashi Aikyo | [1] |
| 2 | Tomoko Anan | [1] |
| 3 | Michiaki Emori | [1] |
| 4 | Koichi Itaya | [1] |
| 5 | Junichi Niimi | [1] |