| |
| 2007 | ||
|---|---|---|
| 1 | EE | Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo: Estimation of delay test quality and its application to test generation. ICCAD 2007: 413-417 |
| 1 | Takashi Aikyo | [1] |
| 2 | Masayasu Fukunaga | [1] |
| 3 | Kazumi Hatayama | [1] |
| 4 | Seiji Kajihara | [1] |
| 5 | Xiaoqing Wen | [1] |
| 6 | Masahiro Yamamoto | [1] |