| 2008 |
|---|
| 4 | EE | Kohei Miyase,
Kenji Noda,
Hideaki Ito,
Kazumi Hatayama,
Takashi Aikyo,
Yuta Yamato,
Hiroshi Furukawa,
Xiaoqing Wen,
Seiji Kajihara:
Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification.
ICCAD 2008: 52-58 |
| 3 | EE | Yuta Yamato,
Yusuke Nakamura,
Kohei Miyase,
Xiaoqing Wen,
Seiji Kajihara:
A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits.
IEICE Transactions 91-D(3): 667-674 (2008) |
| 2006 |
|---|
| 2 | EE | Xiaoqing Wen,
Kohei Miyase,
Tatsuya Suzuki,
Yuta Yamato,
Seiji Kajihara,
Laung-Terng Wang,
Kewal K. Saluja:
Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation.
ICCD 2006 |
| 1 | EE | Xiaoqing Wen,
Seiji Kajihara,
Kohei Miyase,
Yuta Yamato,
Kewal K. Saluja,
Laung-Terng Wang,
Kozo Kinoshita:
A Per-Test Fault Diagnosis Method Based on the X-Fault Model.
IEICE Transactions 89-D(11): 2756-2765 (2006) |
