| 2008 |
|---|
| 3 | EE | Masayuki Arai,
Satoshi Fukumoto,
Kazuhiko Iwasaki,
Tatsuru Matsuo,
Takahisa Hiraide,
Hideaki Konishi,
Michiaki Emori,
Takashi Aikyo:
Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate.
IEICE Transactions 91-D(3): 726-735 (2008) |
| 2003 |
|---|
| 2 | EE | Takahisa Hiraide,
Kwame Osei Boateng,
Hideaki Konishi,
Koichi Itaya,
Michiaki Emori,
Hitoshi Yamanaka,
Takashi Mochiyama:
BIST-Aided Scan Test - A New Method for Test Cost Reduction.
VTS 2003: 359-364 |
| 2001 |
|---|
| 1 | EE | Kwame Osei Boateng,
Hideaki Konishi,
Tsuneo Nakata:
A Method of Static Compaction of Test Stimuli.
Asian Test Symposium 2001: 137-144 |
