| 2007 |
|---|
| 5 | EE | Seiji Kajihara,
Shohei Morishima,
Masahiro Yamamoto,
Xiaoqing Wen,
Masayasu Fukunaga,
Kazumi Hatayama,
Takashi Aikyo:
Estimation of delay test quality and its application to test generation.
ICCAD 2007: 413-417 |
| 2006 |
|---|
| 4 | EE | Masayasu Fukunaga,
Seiji Kajihara,
Xiaoqing Wen,
Toshiyuki Maeda,
Shuji Hamada,
Yasuo Sato:
A dynamic test compaction procedure for high-quality path delay testing.
ASP-DAC 2006: 348-353 |
| 2005 |
|---|
| 3 | EE | Seiji Kajihara,
Masayasu Fukunaga,
Xiaoqing Wen,
Toshiyuki Maeda,
Shuji Hamada,
Yasuo Sato:
Path delay test compaction with process variation tolerance.
DAC 2005: 845-850 |
| 2 | EE | Masayasu Fukunaga,
Seiji Kajihara,
Sadami Takeoka:
On Statistical Estimation of Fault Efficiency for Path Delay Faults Based on Untestable Path Analysis.
IEICE Transactions 88-D(7): 1671-1677 (2005) |
| 2003 |
|---|
| 1 | EE | Masayasu Fukunaga,
Seiji Kajihara,
Sadami Takeoka:
On Estimation of Fault Efficiency for Path Delay Faults.
Asian Test Symposium 2003: 64-67 |
