Kenji Noda

2008
2	EE	Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara: Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. ICCAD 2008: 52-58
1998
1	EE	Michiko Inoue, Takeshi Higashimura, Kenji Noda, Toshimitsu Masuzawa, Hideo Fujiwara: A High-Level Synthesis Method for Weakly Testable Data Paths. Asian Test Symposium 1998: 40-45

Coauthor Index

1	Takashi Aikyo	[2]
2	Hideo Fujiwara	[1]
3	Hiroshi Furukawa	[2]
4	Kazumi Hatayama	[2]
5	Takeshi Higashimura	[1]
6	Michiko Inoue	[1]
7	Hideaki Ito	[2]
8	Seiji Kajihara	[2]
9	Toshimitsu Masuzawa	[1]
10	Kohei Miyase	[2]
11	Xiaoqing Wen	[2]
12	Yuta Yamato	[2]