Koichi Itaya

2003
2	EE	Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama: BIST-Aided Scan Test - A New Method for Test Cost Reduction. VTS 2003: 359-364
1997
1	EE	Michiaki Emori, Junko Kumagai, Koichi Itaya, Takashi Aikyo, Tomoko Anan, Junichi Niimi: ATREX : Design for Testability System for Mega Gate LSIs. Asian Test Symposium 1997: 126-

Coauthor Index

1	Takashi Aikyo	[1]
2	Tomoko Anan	[1]
3	Kwame Osei Boateng	[2]
4	Michiaki Emori	[1] [2]
5	Takahisa Hiraide	[2]
6	Hideaki Konishi	[2]
7	Junko Kumagai	[1]
8	Takashi Mochiyama	[2]
9	Junichi Niimi	[1]
10	Hitoshi Yamanaka	[2]