J. Ishii

1986
1		Takashi Aikyo, Y. Hatano, J. Ishii, N. Karasawa, S. Fujii: An Automatic Test Generation System for Large Scale Gate Arrays. COMPCON 1986: 445-451

Coauthor Index

1	Takashi Aikyo	[1]
2	S. Fujii	[1]
3	Y. Hatano	[1]
4	N. Karasawa	[1]