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2008 | ||
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1 | EE | Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo: Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate. IEICE Transactions 91-D(3): 726-735 (2008) |
1 | Takashi Aikyo | [1] |
2 | Masayuki Arai | [1] |
3 | Michiaki Emori | [1] |
4 | Satoshi Fukumoto | [1] |
5 | Takahisa Hiraide | [1] |
6 | Kazuhiko Iwasaki | [1] |
7 | Hideaki Konishi | [1] |