| |
| 2008 | ||
|---|---|---|
| 1 | EE | Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo: Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate. IEICE Transactions 91-D(3): 726-735 (2008) |
| 1 | Takashi Aikyo | [1] |
| 2 | Masayuki Arai | [1] |
| 3 | Michiaki Emori | [1] |
| 4 | Satoshi Fukumoto | [1] |
| 5 | Takahisa Hiraide | [1] |
| 6 | Kazuhiko Iwasaki | [1] |
| 7 | Hideaki Konishi | [1] |