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N. Karasawa

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1986
1 Takashi Aikyo, Y. Hatano, J. Ishii, N. Karasawa, S. Fujii: An Automatic Test Generation System for Large Scale Gate Arrays. COMPCON 1986: 445-451

Coauthor Index

1Takashi Aikyo [1]
2S. Fujii [1]
3Y. Hatano [1]
4J. Ishii [1]

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