Takahisa Hiraide

2008
4	EE	Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo: Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate. IEICE Transactions 91-D(3): 726-735 (2008)
2006
3	EE	Noriyuki Ito, Akira Kanuma, Daisuke Maruyama, Hitoshi Yamanaka, Tsuyoshi Mochizuki, Osamu Sugawara, Chihiro Endoh, Masahiro Yanagida, Takeshi Kono, Yutaka Isoda, Kazunobu Adachi, Takahisa Hiraide, Shigeru Nagasawa, Yaroku Sugiyama, Eizo Ninoi: Delay defect screening for a 2.16GHz SPARC64 microprocessor. ASP-DAC 2006: 342-347
2003
2	EE	Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama: BIST-Aided Scan Test - A New Method for Test Cost Reduction. VTS 2003: 359-364
1987
1	EE	Gotaro Odawara, Takahisa Hiraide, Osamu Nishina: Partitioning and Placement Technique for CMOS Gate Arrays. IEEE Trans. on CAD of Integrated Circuits and Systems 6(3): 355-363 (1987)

Coauthor Index

1	Kazunobu Adachi	[3]
2	Takashi Aikyo	[4]
3	Masayuki Arai	[4]
4	Kwame Osei Boateng	[2]
5	Michiaki Emori	[2] [4]
6	Chihiro Endoh	[3]
7	Satoshi Fukumoto	[4]
8	Yutaka Isoda	[3]
9	Koichi Itaya	[2]
10	Noriyuki Ito	[3]
11	Kazuhiko Iwasaki	[4]
12	Akira Kanuma	[3]
13	Hideaki Konishi	[2] [4]
14	Takeshi Kono	[3]
15	Daisuke Maruyama	[3]
16	Tatsuru Matsuo	[4]
17	Takashi Mochiyama	[2]
18	Tsuyoshi Mochizuki	[3]
19	Shigeru Nagasawa	[3]
20	Eizo Ninoi	[3]
21	Osamu Nishina	[1]
22	Gotaro Odawara	[1]
23	Osamu Sugawara	[3]
24	Yaroku Sugiyama	[3]
25	Hitoshi Yamanaka	[2] [3]
26	Masahiro Yanagida	[3]

Colors in the list of coauthors