| |
| 1997 | ||
|---|---|---|
| 4 | Stig Oresjo: Unpowered Opens Test with X-Ray Laminography. ITC 1997: 276 | |
| 1996 | ||
| 3 | Stig Oresjo: Unpowered Opens Test with X-Ray Laminography. ITC 1996: 929 | |
| 1993 | ||
| 2 | Kenneth P. Parker, John E. McDermid, Stig Oresjo: Structure and Metrology for an Analog Testability Bus. ITC 1993: 309-322 | |
| 1991 | ||
| 1 | EE | Kenneth P. Parker, Stig Oresjo: A language for describing boundary scan devices. J. Electronic Testing 2(1): 43-75 (1991) |
| 1 | John E. McDermid | [2] |
| 2 | Kenneth P. Parker | [1] [2] |