Bjørg Reppen

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1991

1 EE Bjørg Reppen, Einar J. Aas: Combined probabilistic testability calculation and compact test generation for PLAs. J. Electronic Testing 2(3): 215-227 (1991)

1991
1	EE	Bjørg Reppen, Einar J. Aas: Combined probabilistic testability calculation and compact test generation for PLAs. J. Electronic Testing 2(3): 215-227 (1991)

Coauthor Index

1 Einar J. Aas [1]