1992 | ||
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3 | Matthew L. Fichtenbaum, Robert J. Muller: A VXI Driver-Sensor Instrument with Large Tester Architecture. ITC 1992: 76-83 | |
1991 | ||
2 | EE | Matthew L. Fichtenbaum, Gordon D. Robinson: Scan test architectures for digital board testers. J. Electronic Testing 2(1): 99-105 (1991) |
1982 | ||
1 | Matthew L. Fichtenbaum: Faults Which Challenge the In-Circuit Tester: Some Examples and Some Solutions. ITC 1982: 530-536 |
1 | Robert J. Muller | [3] |
2 | Gordon D. Robinson | [2] |