| 1995 |
|---|
| 9 | | Geetani Edirisooriya,
Samantha Edirisooriya:
Scan Chain Fault Diagnosis with Fault Dictionaries.
ISCAS 1995: 1912-1915 |
| 8 | EE | Samantha Edirisooriya,
Geetani Edirisooriya:
Diagnosis of scan path failures.
VTS 1995: 250-255 |
| 7 | EE | Geetani Edirisooriya,
John P. Robinson:
Authors' reply to comments on "Aliasing Properties of Circular MISRs".
J. Electronic Testing 6(1): 141-142 (1995) |
| 1993 |
|---|
| 6 | | Geetani Edirisooriya,
Samantha Edirisooriya,
John P. Robinson:
On the Performance of Augmented Signature Testing.
ISCAS 1993: 1607-1610 |
| 5 | EE | Geetani Edirisooriya,
John P. Robinson:
Test generation to minimize error masking.
IEEE Trans. on CAD of Integrated Circuits and Systems 12(4): 540-549 (1993) |
| 4 | EE | Geetani Edirisooriya,
John P. Robinson:
Aliasing properties of circular MISRs.
J. Electronic Testing 4(2): 151-158 (1993) |
| 1992 |
|---|
| 3 | | Geetani Edirisooriya,
John P. Robinson:
Aliasing in Multiple-Valued Test Data Compaction.
ISMVL 1992: 43-50 |
| 1991 |
|---|
| 2 | | Geetani Edirisooriya,
John P. Robinson:
Aliasing Probability in Multiple Input Linear Signature Automata for Q-ary Symmetric Errors.
ICCD 1991: 352-355 |
| 1 | EE | Geetani Edirisooriya,
John P. Robinson:
Cyclic code weight spectra and BIST aliasing.
J. Electronic Testing 2(2): 153-163 (1991) |
