| 2002 |
|---|
| 9 | EE | Mounir Benabdenbi,
Walid Maroufi,
Meryem Marzouki:
CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing.
J. Electronic Testing 18(4-5): 455-473 (2002) |
| 2001 |
|---|
| 8 | EE | Mounir Benabdenbi,
Walid Maroufi,
Meryem Marzouki:
Testing TAPed cores and wrapped cores with the same test access mechanism.
DATE 2001: 150-155 |
| 7 | EE | P. Bukovjan,
L. Ducerf-Bourbon,
Meryem Marzouki:
Cost/Quality Trade-off in Synthesis for BIST.
J. Electronic Testing 17(2): 109-119 (2001) |
| 2000 |
|---|
| 6 | EE | Mounir Benabdenbi,
Walid Maroufi,
Meryem Marzouki:
CAS-BUS: A Scalable and Reconfigurable Test Access Mechanism for Systems on a Chip.
DATE 2000: 141-145 |
| 1997 |
|---|
| 5 | EE | J. Abraham,
P. Frankl,
Christian Landrault,
Meryem Marzouki,
Paolo Prinetto,
Chantal Robach,
Pascale Thévenod-Fosse:
Hardware Test: Can We Learn from Software Testing?
VTS 1997: 320-321 |
| 1996 |
|---|
| 4 | EE | Vladimir Castro Alves,
A. Ribeiro Antunes,
Meryem Marzouki:
A Pragmatic, Systematic And Flexible Synthesis For Testability Methodology.
Asian Test Symposium 1996: 263-268 |
| 3 | EE | Firas Mohamed,
Meryem Marzouki:
Test and diagnosis of analog circuits: When fuzziness can lead to accuracy.
J. Electronic Testing 9(1-2): 203-216 (1996) |
| 1993 |
|---|
| 2 | EE | Meryem Marzouki,
Marcelo Lubaszewski,
Mohamed Hedi Touati:
Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards.
ICCAD 1993: 654-657 |
| 1991 |
|---|
| 1 | EE | Meryem Marzouki:
Model-based reasoning for electron-beam debugging of VLSI circuits.
J. Electronic Testing 2(4): 385-394 (1991) |
