| 1995 |
|---|
| 4 | | Rodham E. Tulloss:
Leave the Wires to Last - Funcitonal Evaluation of the IEEE Std 1149.5 Module Test and Maintenance Bus.
ITC 1995: 797-806 |
| 1993 |
|---|
| 3 | | Carl W. Thatcher,
Rodham E. Tulloss:
Towards a Test Standard for Board and System Level Mixed-Signal Interconnects.
ITC 1993: 300-308 |
| 2 | | Rodham E. Tulloss:
IEEE 1149 Standards - Changing Testing, Silicon to Systems.
ITC 1993: 399-408 |
| 1991 |
|---|
| 1 | EE | C. M. Maunder,
Rodham E. Tulloss:
An introduction to the boundary scan standard: ANSI/IEEE Std 1149.1.
J. Electronic Testing 2(1): 27-42 (1991) |
