| |
| 1991 | ||
|---|---|---|
| 2 | EE | R. Kh. Latypov: Comments on "optimizing error masking in BIST by output data modification". J. Electronic Testing 2(3): 307-308 (1991) |
| 1987 | ||
| 1 | R. Kh. Latypov: Built-in Self-testing of Logic Circuits Using Imperfect Duplication. FCT 1987: 279-283 | |