2007 | ||
---|---|---|
1 | EE | Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja: Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. DAC 2007: 527-532 |
1 | Seiji Kajihara | [1] |
2 | Kohei Miyase | [1] |
3 | Kewal K. Saluja | [1] |
4 | Tatsuya Suzuki | [1] |
5 | Xiaoqing Wen | [1] |