| |
| 2008 | ||
|---|---|---|
| 2 | EE | Kohei Miyase, Kenta Terashima, Xiaoqing Wen, Seiji Kajihara, Sudhakar M. Reddy: On Detection of Bridge Defects with Stuck-at Tests. IEICE Transactions 91-D(3): 683-689 (2008) |
| 2005 | ||
| 1 | EE | Kohei Miyase, Kenta Terashima, Seiji Kajihara, Xiaoqing Wen, Sudhakar M. Reddy: On Improving Defect Coverage of Stuck-at Fault Tests. Asian Test Symposium 2005: 216-223 |
| 1 | Seiji Kajihara | [1] [2] |
| 2 | Kohei Miyase | [1] [2] |
| 3 | Sudhakar M. Reddy | [1] [2] |
| 4 | Xiaoqing Wen | [1] [2] |