| 2006 |
|---|
| 11 | EE | Gundolf Kiefer,
H. Lehmann,
Jürgen Weese:
Fast Maximum Intensity Projections of Large Medical Data Sets by Exploiting Hierarchical Memory Architectures.
IEEE Transactions on Information Technology in Biomedicine 10(2): 385-394 (2006) |
| 2003 |
|---|
| 10 | | Vladimir Pekar,
Daniel Hempel,
Gundolf Kiefer,
Marc Busch,
Juergen Wees:
Efficient Visualization of Large Medical Image Datasets on Standard PC Hardware.
VisSym 2003 |
| 2001 |
|---|
| 9 | EE | A. Irion,
Gundolf Kiefer,
Harald P. E. Vranken,
Hans-Joachim Wunderlich:
Circuit partitioning for efficient logic BIST synthesis.
DATE 2001: 86-91 |
| 8 | | Michael Kessler,
Gundolf Kiefer,
Jens Leenstra,
Knut Schünemann,
Thomas Schwarz,
Hans-Joachim Wunderlich:
Using a hierarchical DfT methodology in high frequency processor designs for improved delay fault testability.
ITC 2001: 461-469 |
| 7 | EE | Gundolf Kiefer,
Harald P. E. Vranken,
Erik Jan Marinissen,
Hans-Joachim Wunderlich:
Application of Deterministic Logic BIST on Industrial Circuits.
J. Electronic Testing 17(3-4): 351-362 (2001) |
| 2000 |
|---|
| 6 | | Gundolf Kiefer,
Hans-Joachim Wunderlich,
Harald P. E. Vranken,
Erik Jan Marinissen:
Application of deterministic logic BIST on industrial circuits.
ITC 2000: 105-114 |
| 5 | EE | Gundolf Kiefer,
Hans-Joachim Wunderlich:
Deterministic BIST with Partial Scan.
J. Electronic Testing 16(3): 169-177 (2000) |
| 1999 |
|---|
| 4 | EE | Gundolf Kiefer,
Hans-Joachim Wunderlich:
Deterministic BIST with Multiple Scan Chains.
J. Electronic Testing 14(1-2): 85-93 (1999) |
| 1998 |
|---|
| 3 | EE | Gundolf Kiefer,
Hans-Joachim Wunderlich:
Deterministic BIST with multiple scan chains.
ITC 1998: 1057-1064 |
| 1997 |
|---|
| 2 | | Gundolf Kiefer,
Hans-Joachim Wunderlich:
Using BIST Control for Pattern Generation.
ITC 1997: 347-355 |
| 1996 |
|---|
| 1 | EE | Hans-Joachim Wunderlich,
Gundolf Kiefer:
Bit-flipping BIST.
ICCAD 1996: 337-343 |
