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David Lelouvier

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2002
2EEHarald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier: Enhanced Reduced Pin-Count Test for Full-Scan Design. J. Electronic Testing 18(2): 129-143 (2002)
2001
1 Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier: Enhanced reduced pin-count test for full-scan design. ITC 2001: 738-747

Coauthor Index

1Hérvé Fleury [1] [2]
2Harald P. E. Vranken [1] [2]
3Tom Waayers [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)