| |
| 2002 | ||
|---|---|---|
| 2 | EE | Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier: Enhanced Reduced Pin-Count Test for Full-Scan Design. J. Electronic Testing 18(2): 129-143 (2002) |
| 2001 | ||
| 1 | Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier: Enhanced reduced pin-count test for full-scan design. ITC 2001: 738-747 | |
| 1 | Hérvé Fleury | [1] [2] |
| 2 | Harald P. E. Vranken | [1] [2] |
| 3 | Tom Waayers | [1] [2] |