Hérvé Fleury

2004
4	EE	Hérvé Fleury: Electronic circuit comprising a secret sub-module. ITC 2004: 1412
2002
3	EE	Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier: Enhanced Reduced Pin-Count Test for Full-Scan Design. J. Electronic Testing 18(2): 129-143 (2002)
2001
2		Harald P. E. Vranken, Tom Waayers, Hérvé Fleury, David Lelouvier: Enhanced reduced pin-count test for full-scan design. ITC 2001: 738-747
2000
1	EE	Chouki Aktouf, Hérvé Fleury, Chantal Robach: Inserting Scan at the Behavioral Level. IEEE Design & Test of Computers 17(3): 34-42 (2000)

Coauthor Index

1	Chouki Aktouf	[1]
2	David Lelouvier	[2] [3]
3	Chantal Robach	[1]
4	Harald P. E. Vranken	[2] [3]
5	Tom Waayers	[2] [3]

Colors in the list of coauthors